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Simulation methodology for analysis of substrate noise impact on analog / RF circuits including interconnect resistance
Publication:
Simulation methodology for analysis of substrate noise impact on analog / RF circuits including interconnect resistance
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Date
2005-03
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Soens, Charlotte
;
Van der Plas, Geert
;
Wambacq, Piet
;
Donnay, Stephane
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1797
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations
Metrics
Views
1797
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations