Publication:

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

Date

2019
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorTajalli, A.
dc.contributor.authorCanato, E.
dc.contributor.authorNardo, A.
dc.contributor.authorMeneghini, M.
dc.contributor.authorStockman, Arno
dc.contributor.authorMoens, P.
dc.contributor.authorZanoni, E.
dc.contributor.authorMeneghesso, G.
dc.contributor.imecauthorStockman, Arno
dc.date.accessioned2021-10-27T19:22:17Z
dc.date.available2021-10-27T19:22:17Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34098
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720445
dc.source.beginpage1
dc.source.conference2019 IEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage6
dc.title

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
45519.pdf
Size:
609.11 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions