Publication:
Evaluation of n-type gate-all-around vertically-stacked nanosheet FETs from 473 K down to 173 K for analog applications
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842 since deposited on 2023-10-15
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Acq. date: 2026-02-26
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Views
842 since deposited on 2023-10-15
2last month
Acq. date: 2026-02-26
Citations