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Arsenic and phosphorus co-implantation for deep-submicron CMOS gate and source/drain engineering
Publication:
Arsenic and phosphorus co-implantation for deep-submicron CMOS gate and source/drain engineering
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Augendre, Emmanuel
;
De Keersgieter, An
;
Kubicek, Stefan
;
Redolfi, Augusto
;
Van Laer, Joris
;
Badenes, Gonçal
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1898
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1898
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations