Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Automated testing of bare die-to-die stacks
Publication:
Automated testing of bare die-to-die stacks
Copy permalink
Date
2015
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
De Wachter, Bart
;
Wang, Teng
;
Fiedler, Jens
;
Kiesewetter, Joerg
;
Stoll, Karsten
Journal
Abstract
Description
Statistics
Views
1929
since deposited on 2021-10-22
Acq. date: 2026-07-14
Citations
Statistics
Views
1929
since deposited on 2021-10-22
Acq. date: 2026-07-14
Citations