Publication:
ESD reliability challenges for RF/mixed signal design and processing
Date
| dc.contributor.author | Mahadeva Iyer, Natarajan | |
| dc.contributor.author | Radhakrishnan, M.K. | |
| dc.date.accessioned | 2021-10-15T05:32:58Z | |
| dc.date.available | 2021-10-15T05:32:58Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7848 | |
| dc.source.beginpage | 20 | |
| dc.source.conference | Proceedings 16th Int. Conf. on VLSI Design concurrently with the 21nd Int. Conf. on Embedded Systems Design | |
| dc.source.conferencedate | 4/01/2003 | |
| dc.source.conferencelocation | New Delhi India | |
| dc.source.endpage | 21 | |
| dc.title | ESD reliability challenges for RF/mixed signal design and processing | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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