Publication:

Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta2O5\Ta RRAM device

Date

2014
Proceedings Paper
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-3220-8856
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1276-2278
cris.virtual.orcid0000-0002-4609-5573
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-8528-9469
cris.virtualsource.department10ce60b7-b300-4aba-b6ab-94214c1ed866
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.department025e00cd-cac2-4956-a05e-c7143b22169c
cris.virtualsource.department649f2a57-1fe8-402c-b527-4c3f499c1df1
cris.virtualsource.department8b84673b-878f-4c3b-959d-b7cdae2d70d9
cris.virtualsource.departmentc46dccb2-e527-4b56-b361-a1909f1d1e85
cris.virtualsource.departmentf132e9b7-1dc9-402e-ba4b-18228712eed1
cris.virtualsource.departmentdea1f9e7-d90f-422a-955f-57bcb10cfd54
cris.virtualsource.orcid10ce60b7-b300-4aba-b6ab-94214c1ed866
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid025e00cd-cac2-4956-a05e-c7143b22169c
cris.virtualsource.orcid649f2a57-1fe8-402c-b527-4c3f499c1df1
cris.virtualsource.orcid8b84673b-878f-4c3b-959d-b7cdae2d70d9
cris.virtualsource.orcidc46dccb2-e527-4b56-b361-a1909f1d1e85
cris.virtualsource.orcidf132e9b7-1dc9-402e-ba4b-18228712eed1
cris.virtualsource.orciddea1f9e7-d90f-422a-955f-57bcb10cfd54
dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorChen, Michael
dc.contributor.authorShi, FangFang
dc.contributor.authorDegraeve, Robin
dc.contributor.authorChen, Yangyin
dc.contributor.authorWitters, Thomas
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorWitters, Thomas
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-22T01:41:48Z
dc.date.available2021-10-22T01:41:48Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23871
dc.source.beginpage162
dc.source.conferenceSymposium on VLSI technology
dc.source.conferencedate9/06/2014
dc.source.conferencelocationHonolulu, HI USA
dc.source.endpage163
dc.title

Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta2O5\Ta RRAM device

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
29175.pdf
Size:
1011.31 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions