Publication:
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
| dc.contributor.author | O'Sullivan, Barry | |
| dc.contributor.author | Truijen, Brecht | |
| dc.contributor.author | Putcha, Vamsi | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Alam, Md Nur Kutubul | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | O'Sullivan, Barry | |
| dc.contributor.imecauthor | Truijen, Brecht | |
| dc.contributor.imecauthor | Putcha, Vamsi | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Alam, Md Nur Kutubul | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
| dc.contributor.orcidimec | Truijen, Brecht::0000-0002-2288-1414 | |
| dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Alam, Md Nur Kutubul::0000-0002-4608-3556 | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2023-06-01T15:20:45Z | |
| dc.date.available | 2023-02-27T03:27:54Z | |
| dc.date.available | 2023-06-01T15:20:45Z | |
| dc.date.issued | 2022 | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764588 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41153 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 8 | |
| dc.title | Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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