Publication:
Implementation of a system for metal contamination control based on classification criteria
Date
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-2610-3406 | |
| cris.virtualsource.department | f44fed8c-edfd-4564-84f1-58a59c0caf6c | |
| cris.virtualsource.orcid | f44fed8c-edfd-4564-84f1-58a59c0caf6c | |
| dc.contributor.author | Bearda, Twan | |
| dc.contributor.author | Catana, Gabriela | |
| dc.contributor.author | Hellin, David | |
| dc.contributor.author | Vos, Rita | |
| dc.contributor.imecauthor | Hellin, David | |
| dc.contributor.imecauthor | Vos, Rita | |
| dc.date.accessioned | 2021-10-17T06:15:57Z | |
| dc.date.available | 2021-10-17T06:15:57Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2008 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13355 | |
| dc.source.beginpage | 259 | |
| dc.source.conference | Ultra Clean Processing of Semiconductor Surfaces VIII - UCPSS | |
| dc.source.conferencedate | 18/09/2006 | |
| dc.source.conferencelocation | Antwerpen Belgium | |
| dc.source.endpage | 262 | |
| dc.title | Implementation of a system for metal contamination control based on classification criteria | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |