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On the impact of dopants and Si structure dimensions on {113}-defect formation during in-situ 2 MeV electron-irradiation in an UHVEM
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1847 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-11
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Views
1847 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-11
Citations