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On the impact of dopants and Si structure dimensions on {113}-defect formation during in-situ 2 MeV electron-irradiation in an UHVEM
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On the impact of dopants and Si structure dimensions on {113}-defect formation during in-situ 2 MeV electron-irradiation in an UHVEM
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanhellemont, Jan
;
Anada, Satoshi
;
Nagase, Takeshi
;
Yasuda, H.
;
Schulze, Andreas
;
Bender, Hugo
;
Rooyackers, Rita
;
Vandooren, Anne
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1842
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Views
1842
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2025-12-15
Citations