Publication:

Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET

Date

2021
Journal article
https://doi.org/10.1109/LED.2020.3049093
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dc.contributor.authorLiu, Yefan
dc.contributor.authorClima, Sergiu
dc.contributor.authorHiblot, Gaspard
dc.contributor.authorMatagne, Philippe
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorKaczer, Ben
dc.contributor.authorVelenis, Dimitrios
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.imecauthorLiu, Yefan
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorHiblot, Gaspard
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorVelenis, Dimitrios
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecLiu, Yefan::0000-0002-0783-6148
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecHiblot, Gaspard::0000-0002-3869-965X
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2022-02-24T10:31:05Z
dc.date.available2022-02-24T10:31:05Z
dc.date.issued2021
dc.identifier.doi10.1109/LED.2020.3049093
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39100
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage264
dc.source.endpage267
dc.source.issue2
dc.source.journalIEEE ELECTRON DEVICE LETTERS
dc.source.numberofpages4
dc.source.volume42
dc.title

Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET

dc.typeJournal article
dspace.entity.typePublication
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