Publication:

Study of DID/ID of a single charge trap in UTBOX silicon films

Date

2014
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorFang, Wen
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T01:25:46Z
dc.date.available2021-10-22T01:25:46Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23805
dc.source.beginpage1643
dc.source.conferenceIEEE 12th International Conference on Solid-State and Integrated Circuit Technology - ICSICT
dc.source.conferencedate28/10/2014
dc.source.conferencelocationGuilin China
dc.source.endpage1645
dc.title

Study of DID/ID of a single charge trap in UTBOX silicon films

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions