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Geometry and strain dependence of the proton radiation behavior of MuGFET devices
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Geometry and strain dependence of the proton radiation behavior of MuGFET devices
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Put, Sofie
;
Simoen, Eddy
;
Collaert, Nadine
;
Claeys, Cor
;
Van Uffelen, M.
;
Leroux, P.
Journal
IEEE Trans. Nuclear Science
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1960
since deposited on 2021-10-16
Acq. date: 2025-12-11
Citations
Metrics
Views
1960
since deposited on 2021-10-16
Acq. date: 2025-12-11
Citations