Publication:
Behavior of the 1/f noise and electron mobility in 65 nm FD SOI nMOSFETs employing different tensile-strain-inducing techniques
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1947 since deposited on 2021-10-16
Acq. date: 2025-12-11
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1947 since deposited on 2021-10-16
Acq. date: 2025-12-11
Citations