Publication:

First order and low-frequency noise study of 0.35µm polysilicon bipolar transistor - Influence of RTS noise

Date

1999
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtual.orcid0000-0001-6632-6239
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.departmenta1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcida1ba6cc5-b3a9-4b31-8f64-a47cbd839f9c
dc.contributor.authorJarrix, S. G.
dc.contributor.authorDelseny, C.
dc.contributor.authorPenarier, A.
dc.contributor.authorPascal, F.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-06T11:26:13Z
dc.date.available2021-10-06T11:26:13Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3536
dc.source.beginpage108
dc.source.conferenceICNF 1999. 15th International Conference on Noise in Physical Systems and 1/f Fluctuations
dc.source.conferencedate23/08/1999
dc.source.conferencelocationHong-Kong
dc.source.endpage111
dc.title

First order and low-frequency noise study of 0.35µm polysilicon bipolar transistor - Influence of RTS noise

dc.typeProceedings paper
dspace.entity.typePublication
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