Efficient physical defect model applied to PBTI in high-k stacks

Rzepa, G.; Franco, Jacopo; Subirats, Alexandre; Jech, M.; Vaisman Chasin, Adrian; Grill, A.; Waltl, M.; Knobloch, T.; Stampfer, B.; Chiarella, Thomas; Horiguchi, Naoto; Ragnarsson, Lars-Ake; Linten, Dimitri; Grasser, T.; Kaczer, Ben

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Efficient physical defect model applied to PBTI in high-k stacks

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2017

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Vaisman Chasin, Adrian

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1 since deposited on 2021-10-24

Acq. date: 2026-03-01

1961 since deposited on 2021-10-24

Acq. date: 2026-03-01

Efficient physical defect model applied to PBTI in high-k stacks

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