Publication:
Characterization of coatings with huge internal surfaces by using ellipsometry
Date
| dc.contributor.author | Baklanov, Mikhaïl | |
| dc.date.accessioned | 2021-10-22T00:44:38Z | |
| dc.date.available | 2021-10-22T00:44:38Z | |
| dc.date.issued | 2014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23515 | |
| dc.source.conference | European SENTECH Seminar "Ellipsometry and Reflectometry for Characterizing Thin Films" | |
| dc.source.conferencedate | 24/06/2014 | |
| dc.source.conferencelocation | München Germany | |
| dc.title | Characterization of coatings with huge internal surfaces by using ellipsometry | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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