Characterization of a single-layer quantum wire structure grown directly on a submicron grating

dc.contributor.author	Gustaffson, A.
dc.contributor.author	Samuelson, L.
dc.contributor.author	Hessman, D.
dc.contributor.author	Malm, J. O.
dc.contributor.author	Vermeire, Gerrit
dc.contributor.author	Demeester, Piet
dc.contributor.imecauthor	Demeester, Piet
dc.date.accessioned	2021-09-29T13:06:59Z
dc.date.available	2021-09-29T13:06:59Z
dc.date.issued	1995
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/666
dc.source.beginpage	308
dc.source.endpage	17
dc.source.issue	2
dc.source.journal	J. Vac. Sci. Technol. B
dc.source.volume	13
dc.title	Characterization of a single-layer quantum wire structure grown directly on a submicron grating
dc.type	Journal article
dspace.entity.type	Publication
Files
Publication available in collections:	Articles

Date