Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Implementing cubic-phase HfO2 with $j-value ~ 30 in low-VT replacementgate pMOS devices for improved EOT-Scaling and reliability
Publication:
Implementing cubic-phase HfO2 with $j-value ~ 30 in low-VT replacementgate pMOS devices for improved EOT-Scaling and reliability
Date
2012
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
24426.pdf
515.56 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ragnarsson, Lars-Ake
;
Adelmann, Christoph
;
Higuchi, Yuichi
;
Opsomer, Karl
;
Veloso, Anabela
;
Chew, Soon Aik
;
Rohr, Erica
;
Vecchio, Emma
;
Shi, Xiaoping
;
Devriendt, Katia
;
Sebaai, Farid
;
Kauerauf, Thomas
;
Pawlak, Malgorzata
;
Schram, Tom
;
Van Elshocht, Sven
;
Horiguchi, Naoto
;
Thean, Aaron
Journal
Abstract
Description
Metrics
Views
1875
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
Metrics
Views
1875
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations