Publication:

Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability

Date

2017
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorKraak, Daniel
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-24T02:51:23Z
dc.date.available2021-10-24T02:51:23Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27722
dc.source.conferenceICT Open Workshop
dc.source.conferencedate21/03/2017
dc.source.conferencelocationAmersfoort The Netherlands
dc.title

Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations