Publication:
Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes
Date
| dc.contributor.author | Vandamme, Lorenz | |
| dc.contributor.author | Vandamme, Ewout | |
| dc.contributor.author | Dobbelsteen, J. J. | |
| dc.date.accessioned | 2021-09-30T09:56:31Z | |
| dc.date.available | 2021-09-30T09:56:31Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2262 | |
| dc.source.beginpage | 901 | |
| dc.source.endpage | 908 | |
| dc.source.issue | 6 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 41 | |
| dc.title | Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |