Publication:
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency
| dc.contributor.author | Chuang, Po-Yao | |
| dc.contributor.author | Lorenzelli, Francesco | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Chuang, Po-Yao | |
| dc.contributor.imecauthor | Lorenzelli, Francesco | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Chuang, Po-Yao::0000-0001-7325-8836 | |
| dc.contributor.orcidimec | Lorenzelli, Francesco::0000-0001-6465-7157 | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2024-06-06T07:51:49Z | |
| dc.date.available | 2023-12-14T17:35:40Z | |
| dc.date.available | 2024-06-06T07:51:49Z | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1109/ITC-Asia58802.2023.10301169 | |
| dc.identifier.eisbn | 979-8-3503-1281-2 | |
| dc.identifier.issn | 2768-0681 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43250 | |
| dc.publisher | IEEE | |
| dc.source.conference | 7th IEEE International Test Conference in Asia (ITC-Asia) | |
| dc.source.conferencedate | SEP 12-15, 2023 | |
| dc.source.conferencelocation | Matsue | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 6 | |
| dc.title | Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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