Publication:

Understanding and importance of defects in advanced materials

Date

2009
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid0000-0002-1484-4007
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.department812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid812f2909-a81b-4593-9b32-75331cffa35c
dc.contributor.authorPantisano, Luigi
dc.contributor.authorTrojman, Lionel
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorO'Connor, R.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-18T01:26:14Z
dc.date.available2021-10-18T01:26:14Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15970
dc.source.beginpage651
dc.source.conferenceInternational Semiconductor Technology Conference - ISTC/CSTIC
dc.source.conferencedate19/03/2009
dc.source.conferencelocationShanghai China
dc.source.endpage658
dc.title

Understanding and importance of defects in advanced materials

dc.typeProceedings paper
dspace.entity.typePublication
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