Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Evaluation of Ta(N) diffusion barrier integrity on porous low-k films
Publication:
Evaluation of Ta(N) diffusion barrier integrity on porous low-k films
Copy permalink
Date
2002
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shamiryan, Denis
;
Baklanov, Mikhaïl
;
Tokei, Zsolt
;
Iacopi, Francesca
;
Maex, Karen
Journal
Abstract
Description
Metrics
Views
1847
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-17
Citations
Metrics
Views
1847
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-17
Citations