Publication:

Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations

Date

2025-MAR 15
Journal article
https://doi.org/10.1016/j.mssp.2024.109247
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dc.contributor.authorLaskar, Md Ashiqur Rahman
dc.contributor.authorChakrabarti, Srijan
dc.contributor.authorAhmed, Sakib
dc.contributor.authorGhoreishi, S. Amir
dc.contributor.authorTummala, Pinakapani
dc.contributor.authorAfanas'ev, Valeri
dc.contributor.authorMolle, Alessandro
dc.contributor.authorLamperti, Alessio
dc.contributor.authorCelano, Umberto
dc.contributor.imecauthorAfanas'ev, Valeri
dc.date.accessioned2025-01-26T18:35:31Z
dc.date.available2025-01-26T18:35:31Z
dc.date.issued2025-MAR 15
dc.identifier.doi10.1016/j.mssp.2024.109247
dc.identifier.issn1369-8001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45113
dc.publisherELSEVIER SCI LTD
dc.source.journalMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
dc.source.numberofpages8
dc.source.volume188
dc.subject.keywordsATOMIC-FORCE MICROSCOPY
dc.subject.keywordsMOS2
dc.title

Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations

dc.typeJournal article
dspace.entity.typePublication
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