Publication:

Relaxing the STT-MRAM reliability challenge by scaling MgO thickness

Date

2018
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Author(s)

O'Sullivan, Barry  
;
Van Beek, Simon  
;
Roussel, Philippe  
;
Rao, Siddharth  
;
Kim, Woojin  
;
Couet, Sebastien  
;
Swerts, Johan  
;
Yasin, Farrukh  
;
Crotti, Davide  
;
Linten, Dimitri  
;
Kar, Gouri Sankar  

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1908 since deposited on 2021-10-26
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Acq. date: 2026-08-29

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