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Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
Publication:
Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
Date
2004-09
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rosmeulen, Maarten
;
Breuil, Laurent
;
Lorenzini, Martino
;
Haspeslagh, Luc
;
Van Houdt, Jan
;
De Meyer, Kristin
Journal
Solid-State Electronics
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1883
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1883
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations