Publication:

Carrier lifetime evaluation of electron irradiated SiGe/Si diode

Date

2010
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
dc.contributor.authorIdemoto, T.
dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorTsunoda, I.
dc.contributor.authorYoneoka, M.
dc.contributor.authorNakashima, T.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T17:17:23Z
dc.date.available2021-10-18T17:17:23Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17302
dc.source.beginpage154
dc.source.conference2nd Semiconductor Materials and Devices Forum - SMDF-2
dc.source.conferencedate11/12/2010
dc.source.conferencelocationKumamoto Japan
dc.source.endpage155
dc.title

Carrier lifetime evaluation of electron irradiated SiGe/Si diode

dc.typeProceedings paper
dspace.entity.typePublication
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