Electric field dependence of trap-assisted-tunneling current in strained SiGe source/drain junctions

dc.contributor.author	Bargallo Gonzalez, Mireia
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Vissouvanadin Soubaretty, Bertrand
dc.contributor.author	Eneman, Geert
dc.contributor.author	Verheyen, Peter
dc.contributor.author	Loo, Roger
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Eneman, Geert
dc.contributor.imecauthor	Verheyen, Peter
dc.contributor.imecauthor	Loo, Roger
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimec	Eneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimec	Loo, Roger::0000-0003-3513-6058
dc.date.accessioned	2021-10-17T21:20:06Z
dc.date.available	2021-10-17T21:20:06Z
dc.date.issued	2009
dc.identifier.issn	0003-6951
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/14947
dc.source.beginpage	233507
dc.source.issue	23
dc.source.journal	Applied Physics Letters
dc.source.volume	94
dc.title	Electric field dependence of trap-assisted-tunneling current in strained SiGe source/drain junctions
dc.type	Journal article
dspace.entity.type	Publication
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