Publication:
Atomic insight into relaxation mechanism of Ge(1-x)Sn(x) using atom probe tomography
Date
| dc.contributor.author | Kumar, Arul | |
| dc.contributor.author | Kambham, Ajay Kumar | |
| dc.contributor.author | Gilbert, Matthieu | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-20T12:25:01Z | |
| dc.date.available | 2021-10-20T12:25:01Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20962 | |
| dc.source.conference | E-MRS Spring Meeting Symposium A: Advanced Silicon Materials Research for Electronic and Photovoltaic Applications III | |
| dc.source.conferencedate | 14/05/2012 | |
| dc.source.conferencelocation | Strasbourg France | |
| dc.title | Atomic insight into relaxation mechanism of Ge(1-x)Sn(x) using atom probe tomography | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
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