Publication:

Pitfalls when using the SEED methodology

Date

2012
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid0000-0001-8434-1838
cris.virtual.orcid0000-0002-6481-2951
cris.virtual.orcid0000-0003-2889-8345
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.department63eea5a8-b81a-4bb2-aa67-715ba610971a
cris.virtualsource.departmente0386a23-f2bf-4f53-a36f-c1380bca0db7
cris.virtualsource.departmentad583f8b-e9a4-4802-a0a1-879d087730ad
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid63eea5a8-b81a-4bb2-aa67-715ba610971a
cris.virtualsource.orcide0386a23-f2bf-4f53-a36f-c1380bca0db7
cris.virtualsource.orcidad583f8b-e9a4-4802-a0a1-879d087730ad
dc.contributor.authorScholz, Mirko
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThijs, Steven
dc.contributor.authorSawada, Ken
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.accessioned2021-10-20T15:50:48Z
dc.date.available2021-10-20T15:50:48Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21473
dc.source.beginpage400
dc.source.conferenceInternational ESD Workshop - IEW
dc.source.conferencedate14/05/2012
dc.source.conferencelocationOud Turnhout Belgium
dc.source.endpage409
dc.title

Pitfalls when using the SEED methodology

dc.typeProceedings paper
dspace.entity.typePublication
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