Publication:
Advanced interconnect technology and reliability
Date
| dc.contributor.author | Li, Yunlong | |
| dc.contributor.author | Chao, Zhao | |
| dc.contributor.imecauthor | Li, Yunlong | |
| dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
| dc.date.accessioned | 2021-10-25T22:02:34Z | |
| dc.date.available | 2021-10-25T22:02:34Z | |
| dc.date.issued | 2018-04 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/31181 | |
| dc.identifier.url | www.sciencedirect.com/science/book/9780081021392 | |
| dc.source.beginpage | 215 | |
| dc.source.book | CMOS Past, Present and Future | |
| dc.source.endpage | 247 | |
| dc.title | Advanced interconnect technology and reliability | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |