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Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations

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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-1484-4007
cris.virtualsource.departmentde93b028-9708-4f3a-99f0-5edbf35f1ef2
cris.virtualsource.department812f2909-a81b-4593-9b32-75331cffa35c
cris.virtualsource.orcidde93b028-9708-4f3a-99f0-5edbf35f1ef2
cris.virtualsource.orcid812f2909-a81b-4593-9b32-75331cffa35c
dc.contributor.authorOshima, Azusa
dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorKobayashi, Kazutoshi
dc.contributor.authorMatsumoto, Takashi
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-22T21:31:22Z
dc.date.available2021-10-22T21:31:22Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25713
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7165891
dc.source.beginpage1
dc.source.conferenceInternational Conference on IC Design & Technology - ICICDT
dc.source.conferencedate1/06/2015
dc.source.conferencelocationLeuven Belgium
dc.source.endpage4
dc.title

Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations

dc.typeProceedings paper
dspace.entity.typePublication
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