Publication:
Interface trap characterization and Fermi-level pinning in Si-passivated Ge/HfO2 capacitors
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1871 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-16
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Statistics
Views
1871 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-16
Citations