Publication:

Work function of Ni3Si2 on HfSixOy and SiO2 and its implication for Ni fully silicided gate applications

Date

 
dc.contributor.authorKittl, Jorge
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorKaushik, Vidya
dc.contributor.authorLauwers, Anne
dc.contributor.authorPawlak, M.A.
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorDemeurisse, Caroline
dc.contributor.authorVrancken, Christa
dc.contributor.authorVeloso, Anabela
dc.contributor.authorAbsil, Philippe
dc.contributor.authorBiesemans, Serge
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorDemeurisse, Caroline
dc.contributor.imecauthorVrancken, Christa
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.date.accessioned2021-10-16T17:08:27Z
dc.date.available2021-10-16T17:08:27Z
dc.date.issued2007-01
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12405
dc.source.beginpage32103
dc.source.issue3
dc.source.journalApplied Physics Letters
dc.source.volume90
dc.title

Work function of Ni3Si2 on HfSixOy and SiO2 and its implication for Ni fully silicided gate applications

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections: