Publication:

Frequency-Modulated Continuous-Wave Chirp Frequency Error and Phase Noise Measurement: How to Characterize Frequency-Modulated Continuous-Wave Chirp Using Commercial Oscilloscope

Date

2024
Journal article
https://doi.org/10.1109/MMM.2024.3408000
Simple item page Full metadata Statistics
 
dc.contributor.authorRenukaswamy, Pratap
dc.contributor.authorBauduin, Marc
dc.contributor.authorMarkulic, Nereo
dc.contributor.authorCraninckx, Jan
dc.contributor.imecauthorBauduin, Marc
dc.contributor.imecauthorMarkulic, Nereo
dc.contributor.imecauthorCraninckx, Jan
dc.contributor.imecauthorRenukaswamy, Pratap
dc.contributor.orcidimecBauduin, Marc::0000-0003-0052-6750
dc.contributor.orcidimecMarkulic, Nereo::0000-0001-6691-4647
dc.contributor.orcidimecCraninckx, Jan::0000-0002-3980-0203
dc.contributor.orcidimecRenukaswamy, Pratap::0000-0003-4148-7188
dc.date.accessioned2025-04-30T09:15:45Z
dc.date.available2024-11-01T18:27:59Z
dc.date.available2025-04-30T09:15:45Z
dc.date.issued2024
dc.identifier.doi10.1109/MMM.2024.3408000
dc.identifier.issn1527-3342
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44724
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage43
dc.source.endpage53
dc.source.issue11
dc.source.journalIEEE MICROWAVE MAGAZINE
dc.source.numberofpages11
dc.source.volume25
dc.subject.keywordsPLL
dc.title

Frequency-Modulated Continuous-Wave Chirp Frequency Error and Phase Noise Measurement: How to Characterize Frequency-Modulated Continuous-Wave Chirp Using Commercial Oscilloscope

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles