Publication:
Thin, thinner, thinnest: a new methodology for micrometric tech
Date
| dc.contributor.author | Parton, Els | |
| dc.contributor.author | Beaucarne, Guy | |
| dc.contributor.author | Dross, Frederic | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.imecauthor | Parton, Els | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2021-10-17T09:37:00Z | |
| dc.date.available | 2021-10-17T09:37:00Z | |
| dc.date.issued | 2008 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14272 | |
| dc.source.beginpage | 28 | |
| dc.source.endpage | 29 | |
| dc.source.issue | 9 | |
| dc.source.journal | Solar Industry | |
| dc.source.volume | 1 | |
| dc.title | Thin, thinner, thinnest: a new methodology for micrometric tech | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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