Publication:

On-chip jitter measurement for true random number generators

Date

2017
Proceedings Paper
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dc.contributor.authorYang, Bohan
dc.contributor.authorRozic, Vladimir
dc.contributor.authorGrujic, Milos
dc.contributor.authorMentens, Nele
dc.contributor.authorVerbauwhede, Ingrid
dc.contributor.imecauthorMentens, Nele
dc.date.accessioned2021-10-24T19:34:03Z
dc.date.available2021-10-24T19:34:03Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29985
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8354001
dc.source.beginpage91
dc.source.conferenceAsian Hardware Oriented Security and Trust Symposium - AsianHOST
dc.source.conferencedate19/10/2017
dc.source.conferencelocationBeijing China
dc.source.endpage96
dc.title

On-chip jitter measurement for true random number generators

dc.typeProceedings paper
dspace.entity.typePublication
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