Publication:

Open volume defects in ultra-thin TiO2 layers embedded in VMCO-like samples studied with positron annihilation spectroscopy

Date

2022
Journal article
https://doi.org/10.1063/5.0094558
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dc.contributor.authorKhanam, Afrina
dc.contributor.authorSlotte, Jonatan
dc.contributor.authorTuomisto, Filip
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecSubhechha, Subhali::0000-0002-1960-5136
dc.contributor.orcidimecPopovici, Mihaela Ioana::0000-0002-9838-1088
dc.date.accessioned2022-11-10T14:47:42Z
dc.date.available2022-07-15T02:28:32Z
dc.date.available2022-11-10T14:47:42Z
dc.date.embargo2023-06-24
dc.date.issued2022
dc.description.wosFundingTextAfina Khanam acknowledges Tekniikan edistaemissaeaetioe for the financial support.
dc.identifier.doi10.1063/5.0094558
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40116
dc.publisherAIP Publishing
dc.source.beginpage245301
dc.source.endpagena
dc.source.issue24
dc.source.journalJOURNAL OF APPLIED PHYSICS
dc.source.numberofpages6
dc.source.volume131
dc.subject.keywordsELECTRON
dc.title

Open volume defects in ultra-thin TiO2 layers embedded in VMCO-like samples studied with positron annihilation spectroscopy

dc.typeJournal article
dspace.entity.typePublication
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