Publication:
On the frequency dispersion of the capacitance-voltage behavior of epitaxial Ge on Si p+-n junctions
Date
| dc.contributor.author | Yang, Rui | |
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Wang, Gang | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-18T05:30:55Z | |
| dc.date.available | 2021-10-18T05:30:55Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16573 | |
| dc.source.beginpage | 74511 | |
| dc.source.issue | 7 | |
| dc.source.journal | Journal of Applied Physics | |
| dc.source.volume | 106 | |
| dc.title | On the frequency dispersion of the capacitance-voltage behavior of epitaxial Ge on Si p+-n junctions | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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