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The influence of different stress techniques and proton radiation on GIDL in triple-gate SOI devices
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The influence of different stress techniques and proton radiation on GIDL in triple-gate SOI devices
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Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Agopian, P.G.D.
;
Bordallo, C.
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, J.A.
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Views
1815
since deposited on 2021-10-20
1
last month
1
last week
Acq. date: 2025-12-12
Citations