Publication:

Superior reliability of high mobility (Si)Ge channel pMOSFETs

Date

2013
Meeting abstract
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Author(s)

Franco, Jacopo  
;
Kaczer, Ben  
;
Toledano Luque, Maria
;
Roussel, Philippe  
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Mitard, Jerome  
;
Eneman, Geert  
;
Witters, Liesbeth  
;
Grasser, Tibor
;
Groeseneken, Guido  

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