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Damage in nickel silicides during FIB specimen preparation
Publication:
Damage in nickel silicides during FIB specimen preparation
Date
2011
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verleysen, Eveline
;
Bender, Hugo
;
Favia, Paola
;
Schryvers, Dominique
;
Vandervorst, Wilfried
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Abstract
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1989
since deposited on 2021-10-19
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Acq. date: 2025-12-08
Citations
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Views
1989
since deposited on 2021-10-19
1
last month
1
last week
Acq. date: 2025-12-08
Citations