Publication:

Improved robustness of GaN-on-Si HEMTs under high electric field conditions by etching gate technology

Date

2008
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Marcon, Denis  
;
Lorenz, Anne
;
Derluyn, Joff
;
Das, Jo
;
Mertens, Robert  
;
Germain, Marianne
;
Borghs, Gustaaf  

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