Publication:

Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM

Date

2013
Presentation
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dc.contributor.authorCelano, Umberto
dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorMoussa, Alain
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorMannarino, Manuel
dc.contributor.authorNazir, Aftab
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorMoussa, Alain
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorMannarino, Manuel
dc.contributor.imecauthorNazir, Aftab
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.date.accessioned2021-10-21T06:53:54Z
dc.date.available2021-10-21T06:53:54Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22112
dc.source.conferenceSPM Dutch User Meeting 2013
dc.source.conferencedate26/05/2013
dc.source.conferencelocationEindhoven Nederlands
dc.title

Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM

dc.typeOral presentation
dspace.entity.typePublication
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