Publication:

Esitmation of stress-induced antiguiding by the anodic oxide covering the sides of the ridge waveguide laser diode

Date

1999
Meeting abstract
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dc.contributor.authorBuda, M.
dc.contributor.authorIordache, G.
dc.contributor.authorAcket, G. A.
dc.contributor.authorvan de Roer, T. G.
dc.contributor.authorvan Roy, B. H.
dc.contributor.authorSmalbrugge, E.
dc.contributor.authorKaufmann, L. M. F.
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorSys, Carl
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.date.accessioned2021-10-06T10:46:53Z
dc.date.available2021-10-06T10:46:53Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3285
dc.source.conferenceSemiconductor and Integrated Optoelectronics - SIOE
dc.source.conferencedate07/04/1999
dc.source.conferencelocationCardiff UK
dc.title

Esitmation of stress-induced antiguiding by the anodic oxide covering the sides of the ridge waveguide laser diode

dc.typeMeeting abstract
dspace.entity.typePublication
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