Publication:

ESD protection methodology for deep-submicron CMOS

Date

1998
Proceedings Paper
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
dc.contributor.authorBock, Karlheinz
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-30T11:29:08Z
dc.date.available2021-09-30T11:29:08Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2405
dc.source.beginpage997
dc.source.conferenceProceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF
dc.source.conferencedate5/10/1998
dc.source.conferencelocation
dc.source.endpage1007
dc.title

ESD protection methodology for deep-submicron CMOS

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
2734.pdf
Size:
1.08 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions