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Development and evaluation of a-SiCO:H films as Cu and moisture diffusion barriers with a low dielectric constant, for advanced interconnects

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1894 since deposited on 2021-10-21
1last month
Acq. date: 2026-05-18

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Views

1894 since deposited on 2021-10-21
1last month
Acq. date: 2026-05-18

Citations