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Conference contributions
EUV based multi-patterning schemes for advanced DRAM nodes
Publication:
EUV based multi-patterning schemes for advanced DRAM nodes
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2615644
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Das, Sayantan
;
Sah, Kaushik
;
Fallica, Roberto
;
Chen, Zhijin
;
Halder, Sandip
;
Cross, Andrew
;
De Simone, Danilo
;
Treska, Fergo
;
Leray, Philippe
;
Kim, Ryan Ryoung han
;
Maguire, Ethan
;
Wei, Chih-, I
;
Fenger, Germain
;
Lafferty, Neal
;
Lee, Jeonghoon
Journal
Proceedings of SPIE
Abstract
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1207
since deposited on 2022-09-08
Acq. date: 2025-10-26
Citations
Metrics
Views
1207
since deposited on 2022-09-08
Acq. date: 2025-10-26
Citations