Publication:
Monitoring of Trace Molecular Impurities in Clean-Room Air
Date
| dc.contributor.author | Kenis, Karine | |
| dc.contributor.author | Mertens, Paul | |
| dc.contributor.author | Altamirano Sanchez, Efrain | |
| dc.contributor.author | Van Ongeval, Joost | |
| dc.contributor.author | De Vita, Marie | |
| dc.contributor.imecauthor | Kenis, Karine | |
| dc.contributor.imecauthor | Mertens, Paul | |
| dc.contributor.imecauthor | Altamirano Sanchez, Efrain | |
| dc.contributor.imecauthor | Van Ongeval, Joost | |
| dc.contributor.orcidimec | Altamirano Sanchez, Efrain::0000-0003-3235-6055 | |
| dc.contributor.orcidimec | Kenis, Karine::0000-0001-7116-7498 | |
| dc.date.accessioned | 2025-02-10T14:10:14Z | |
| dc.date.available | 2023-09-04T10:16:39Z | |
| dc.date.available | 2025-02-10T14:10:14Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2023-08 | |
| dc.identifier.issn | 1662-9779 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42465 | |
| dc.publisher | Trans Tech Publications | |
| dc.source.beginpage | 183 | |
| dc.source.conference | UCPPS - 16th International Symposium on Ultra Clean Processing of Semiconductor Surfaces | |
| dc.source.conferencedate | 11 -14 September 2023 | |
| dc.source.conferencelocation | Brugge | |
| dc.source.endpage | 188 | |
| dc.source.journal | Solid State Phenomena; Vol. 346 | |
| dc.source.numberofpages | 6 | |
| dc.title | Monitoring of Trace Molecular Impurities in Clean-Room Air | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |